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Results 1 to 10 of 10, sorted by name.

Dr Michael Neumann-Spallart   Michael Neumann-Spallart (Lab. de Physique des Solides, Groupe d'études de la matière condensée (GEMAC), CNRS, France)
Detailed scientific research interests: physical chemistry, semiconductor, thin film.
Search for papers by Neumann-Spallart, M. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Dr Dirk Poelman   Dirk Poelman (Dept. of Solid State Sciences, Ghent University, Belgium)
General scientific interests: electron microscopy, oxides, semiconductors, X-ray diffraction, XAFS.
Detailed scientific research interests: polycrystalline films, semiconductor defects, thin film luminescence, thin film optics.
Search for papers by Poelman, D. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Pavol Sutta   Pavol Sutta (Materials and Technology, University of West Bohemia, Czech Republic)
General scientific interests: ceramics, epitaxy, ferroelectrics, materials science, X-ray diffraction.
Detailed scientific research interests: education, real structure, semiconductor, thin film.
Search for papers by Sutta, P. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Vipulkumar Kheraj   Vipulkumar Kheraj (Department of Applied Physics, S. V. National Institute of Technology, Surat, India)
General scientific interests: crystal growth, inorganic compounds, materials science, semiconductors, teaching and education, thin films.
Detailed scientific research interests: Semiconductor Photovoltaic Materials, Thin-Film Solar Cells.
Search for papers by Kheraj, V. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Takayoshi Shimura   Takayoshi Shimura (Dept. of Material&Life Science , Osaka University, Japan)
General scientific interests: crystal engineering, Laue diffraction, semiconductors, synchrotron radiation, thin films, X-ray diffraction, X-ray topography.
Detailed scientific research interests: crystal truncation rod scattering, semiconductor, silicon oxides, surface, thin film.
Search for papers by Shimura, T. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Eva Majkova   Eva Majková (Dept. of Metal Physics, Inst. of Physics, Slovak Acad. Sci., Dúbravská cesta 9, 28 Bratislava, Slovak Republic, 842, Slovakia (Slovak Republic))
General scientific interests: phase determination.
Detailed scientific research interests: amorphous phase, disordered structure, electrical conductivity, metal, multilayer, semiconductor, thin film.
Search for papers by Majková, E. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Osamu Nittono   Osamu Nittono (Metallurgy and Ceramics, Tokyo Institute of Technology, Japan)
General scientific interests: dynamical diffraction, materials science, X-ray topography.
Detailed scientific research interests: diffraction technique, magnetic film, metallurgy, multilayered film, nano-structure, phase transformation, semiconductor, structural change, thin film, X-ray goniometry.
Search for papers by Nittono, O. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Malle Krunks   Malle Krunks (Institute of Materials Technology, Tallinn Technical University, Estonia)
General scientific interests: databases, materials science, organometallic compounds, powder diffraction, Rietveld method, semiconductors, X-ray diffraction.
Detailed scientific research interests: binary ternary semiconductor thin film, cadmium, copper, indium, zinc complex compound, nanocrystals, nanotechnology, recrystallisation, thermoanalysis.
Search for papers by Krunks, M. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Hitoshi Ohsato   Hitoshi Ohsato (Department of Research, Nagoya Industrial Science Research Institute (Nisri), Japan)
General scientific interests: ceramics, chemical crystallography, materials science, Rietveld method, X-ray diffraction.
Detailed scientific research interests: dielectric ceramics, epitaxy topotaxy, inorganic materials sciences, one-dimensional tunnel structure, semiconductor thin film, structure analysis, tungsten bronze.
Search for papers by Ohsato, H. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Stephen B. Robie   Stephen B. Robie (Evans Analytical Group, 810 Kifer Rd, USA)
General scientific interests: electron diffraction, epitaxy, materials science, phase determination, residual stress, semiconductors, texture, thin films, X-ray diffraction.
Detailed scientific research interests: grazing incidence diffraction, high resolution X-ray diffraction, orientation imaging microscopy, semiconductor materials, thin film characterization, total reflection X-ray fluorescence, X-ray fluorescence spectroscopy, X-ray reflectivity.
Search for papers by Robie, S.B. in Crystallography Journals Online | Google Scholar | Pubmed