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Results 1 to 7 of 7, sorted by name.

Professor Dr Jorg Ihringer   Jörg Ihringer (Institut für Angewandte Physik , Universität Tübingen, Germany)
General scientific interests: anomalous dispersion, ferroelectrics, instrumentation, Rietveld method, X-ray diffraction.
Detailed scientific research interests: apparatus, powder, profile analysis, pseudosymmetry, real structure.
Search for papers by Ihringer, J. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Jaroslav Fiala   Jaroslav Fiala (SKODA Research Ltd 46Plzeň, Tylova, Czech Republic)
General scientific interests: statistics.
Detailed scientific research interests: material engineering, phase abundance analysis, phase identification, real structure analysis.
Search for papers by Fiala, J. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Antonin Buchal   Antonín Buchal (Instrumental CentreFaculty of EngineeringTechnická, Technical University of Brno, Czech Republic)
General scientific interests: phase determination, powder diffraction.
Detailed scientific research interests: diffractometry, profile analysis, real structure, software, strain, stress.
Search for papers by Buchal, A. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Tamas Ungar   Tamás Ungár (Materials Physics Department , Eötvös University Budapest, Hungary)
General scientific interests: alloys, defects, materials science, metals, powder diffraction, residual stress, X-ray diffraction.
Detailed scientific research interests: dislocations, line profile analysis, microstructure, real structure, size and strain, size distribution.
Search for papers by Ungár, T. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Dr David Rafaja   David Rafaja (Institute of Materials Science, Technical Unversity Bergakademie Freiberg, Germany)
General scientific interests: defects, materials science, Rietveld method, thin films, X-ray diffraction.
Detailed scientific research interests: electron microscopy, low-dimensional materials, nanocrystalline materials, real structure analysis, size strain analysis, X-ray diffraction, X-ray scattering.
Search for papers by Rafaja, D. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Sergey A. Ivanov   Sergey A. Ivanov (Karpov Institute of Physical Chemistry, X-ray Laboratory, 10 Obukha St., K-64, Russia, Russian Federation)
General scientific interests: Rietveld method.
Detailed scientific research interests: Debye Waller factor, ferroelectricity, inorganic compound, line profile analysis, phase transition, real structure, thermal expansion, X-ray powder diffraction.
Search for papers by Ivanov, S.A. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Kenji Sakurai   Kenji Sakurai (Synchrotron X-ray Group, National Institute for Materials Science, Japan)
General scientific interests: glasses, imaging, instrumentation, surfaces, thin films.
Detailed scientific research interests: 2D/3D real space imaging of polycrystalline materials, Structure of buried function interfaces, ultra trace element analysis, X-ray and neutron reflectivity, X-ray fluorescence and imaging.
Search for papers by Sakurai, K. in Crystallography Journals Online | Google Scholar | Pubmed