Results 1 to 9 of 9, sorted by name.
Oliver Wagstaff (Chemistry, Durham University, United Kingdom) General scientific interests: neutron scattering, oxides, powder diffraction, Rietveld method, X-ray diffraction. Detailed scientific research interests: Complex oxides, ionic conductivity, Molecular dynamics, Perovskites, Powder Diffraction, quantitative Rietveld structural analysis, quantitative X-ray diffraction, quantitative X-ray powder diffraction, Rietveld Refinement. | ||||
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Izabella Farkas (MOL Plc., New Technologies and Research &Development, Batthyany u. 45, Hungary) General scientific interests: crystal chemistry, minerals, phase determination, powder diffraction, Rietveld method, structure determination, X-ray diffraction. Detailed scientific research interests: quantitative mineral analysis of clays and other minerals, X-ray powder diffraction,. | ||||
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![]() | José-Maria Amigó (Geology, Univ. Valencia, Spain) General scientific interests: ceramics, crystal chemistry, databases, direct methods, geochemistry, materials science, minerals, molecular replacement, phase determination, powder diffraction, Rietveld method, structure determination, symmetry, teaching and education, X-ray diffraction. Detailed scientific research interests: microstructural analysis by X-ray powder diffraction, quantitative X-ray diffractometry, single and powder crystal structure determination by X-ray diffraction. | |||
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![]() | David L. Bish (Department of Geological Sciences, Indiana University, USA) General scientific interests: crystal chemistry, geochemistry, minerals, neutron scattering, powder diffraction, Rietveld method, silicates, teaching and education, X-ray diffraction, zeolites. Detailed scientific research interests: clay mineralogy, natural zeolites, quantitative X-ray diffraction analysis, Rietveld refinement, silicate mineralogy, thermal analysis. | |||
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John Anthony Leake (St John's College, University of Cambridge, United Kingdom) General scientific interests: alloys, ceramics, defects, diffuse scattering, disorder, dynamical diffraction, electron diffraction, electron microscopy, epitaxy, glasses, materials science, metals, phase transitions, physical crystallography, powder diffraction, residual stress, semiconductors, superconductors, teaching and education, texture, thin films, X-ray diffraction. Detailed scientific research interests: characterisation of materials, high resolution X-ray diffraction, multilayers, quantitative phase analysis, structural relaxation in glasses, thin films. | ||||
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![]() | Jovica Stojanovic (Applied Mineralogy Unit, Institute for Nuclear and Other Mineral Raw Materials, Serbia) General scientific interests: crystal chemistry, crystal growth, electron microscopy, hydrogen bonding, inorganic compounds, materials science, minerals, natural products, phase determination, powder diffraction, Rietveld method, silicates, structure determination, X-ray diffraction, zeolites. Detailed scientific research interests: Electron Microscopy Electron Microprobe Analysis, Hydrothermal synthesis of inorganic compounds, Rietveld method qualitative and quantitative phase analysis, X-ray powder and single-crystal diffraction analysis. | |||
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![]() | Miguel Angel Garcia Aranda (Quimica Inorganica, Universidad de Malaga, Spain) General scientific interests: crystal chemistry, imaging, Rietveld method, synchrotron radiation, X-ray diffraction. Detailed scientific research interests: 1. Quantitative phase analysis of industrial materials by the Rietveld method, 2. In-situ hydration studies of new eco-cements., 3. Simultaneous X-ray powder diffraction and X-ray tomographic analyses. | |||
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![]() | Juan Alfredo Guevara Carrio (Centre for Advanced 2D Materials, National University of Singapore, Singapore) General scientific interests: ceramics, materials science, nanomaterials, Rietveld method, X-ray diffraction. Detailed scientific research interests: 2D materials and graphene based membranes, ab-initio structure determination, accurate structure analysis, cement calcium silicate powder X-ray diffraction, ceramic materials, characterization of materials, characterization of microstructure of ceramics, materials structure and characterization, neutron powder diffractometry, quantitative Rietveld structural analysis, Rietveld structure analysis. | |||
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