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Dr Luis Martinez   Luis Martinez (Materials Science & Technology, Nuclear and Energy Research Institute - IPEN/CNEN, Brazil)
General scientific interests: materials science, powder diffraction, residual stress, Rietveld method, X-ray diffraction.
Detailed scientific research interests: diffraction standard reference samples, line profile analysis, materials characterization, neutron powder diffractometry, nuclear fuel.
Search for papers by Martinez, L.G. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Richard M. Ibberson   Richard M. Ibberson (Neutron Sciences, Oak Ridge National Laboratory, USA)
General scientific interests: chemical crystallography, cryocrystallography, instrumentation, materials science, Rietveld method.
Detailed scientific research interests: dielectric ceramics, high-resolution diffractometry, neutron powder diffraction, small molecules organic, structural analysis of molecular crystals, structure from powder diffraction.
Search for papers by Ibberson, R.M. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Juan Alfredo Guevara Carrio   Juan Alfredo Guevara Carrio (Centre for Advanced 2D Materials, National University of Singapore, Singapore)
General scientific interests: ceramics, materials science, nanomaterials, Rietveld method, X-ray diffraction.
Detailed scientific research interests: 2D materials and graphene based membranes, ab-initio structure determination, accurate structure analysis, cement calcium silicate powder X-ray diffraction, ceramic materials, characterization of materials, characterization of microstructure of ceramics, materials structure and characterization, neutron powder diffractometry, quantitative Rietveld structural analysis, Rietveld structure analysis.
Search for papers by Guevara Carrio, J.A. in Crystallography Journals Online | Google Scholar | Pubmed