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Results 1 to 10 of 16, sorted by name.
| Xiaoming Jiang (Institute of High Energy Physics, Synchrotron Radiation Laboratory, Chinese Academy of Sciences, PO Box 918, China) General scientific interests: diffuse scattering. Detailed scientific research interests: multilayer. | ||||
| Search for papers by Jiang, X. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Alain Marty (CENG/DRMC/SPMM, 17 av. des Martyrs, Cedex 9, Grenoble, France) General scientific interests: magnetism. Detailed scientific research interests: MBE multilayer, ordering, STM. | ||||
| Search for papers by Marty, A. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Jürgen Kräußlich (Institut für Optik und Quantenelektronik, Friedrich- Schiller-Univerität Jena, Germany) General scientific interests: anomalous dispersion, dynamical diffraction, epitaxy, surfaces, X-ray topography. Detailed scientific research interests: multilayer, silicon compounds, thin films. | ||||
| Search for papers by Kräußlich, J. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Marina A. Andreeva (Lomonosov Moscow State University, Leninskie Gory, 1, Russian Federation) General scientific interests: magnetism, neutron scattering, X-ray diffraction. Detailed scientific research interests: Mossbauer diffraction, multilayer structure, surface structure. | ||||
| Search for papers by Andreeva, M.A. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
 | Václav Valvoda (Dept of Electronic Structures, Faculty of Mathematics and Physics, Czech Republic) General scientific interests: ceramics, materials science, powder diffraction, teaching and education, texture, thin films, X-ray diffraction. Detailed scientific research interests: microstructure, multilayer, solid-state physics, thin film. | |||
| Search for papers by Valvoda, V. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Zhenhong Mai (Institute of Physics, Chinese Academy of Sciences, China) Detailed scientific research interests: crystal defect, liquid structure, multilayer structures, topography. | ||||
| Search for papers by Mai, Z. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Isabelle Schuster (CEA, 17 rue des Martyrs, Polygone Scientifique Louis Néel, SP2M/SGX, Cedex 9, Grenoble, France) Detailed scientific research interests: high-resolution diffractometry, multilayer, temperature diffractometry, X-ray characterization. | ||||
| Search for papers by Schuster, I. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Pavel Kacerovský (Lab. of X-ray Diagnostic, Inst. of Radioengineering and Electronics, Acad. Sci. Cz. Rep., Chaberská 57, 8, Praha, Czech Republic) General scientific interests: X-ray diffraction. Detailed scientific research interests: defect, material science, multilayer, single crystal, X-ray characterization. | ||||
| Search for papers by Kacerovský, P. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Jacques Teillet (Univ. de Rouen, Lab. Magnétisme et Applications, URA CNRS 808, Mont-Saint-Aignan Cedex, France) Detailed scientific research interests: magnetic film, magnetism Mossbauer analysis, multilayer structure, nanostructure, permanent magnet. | ||||
| Search for papers by Teillet, J. in Crystallography Journals Online | Google Scholar | Pubmed | ||||
| Eva Majková (Dept. of Metal Physics, Inst. of Physics, Slovak Acad. Sci., Dúbravská cesta 9, 28 Bratislava, Slovak Republic, 842, Slovakia (Slovak Republic)) General scientific interests: phase determination. Detailed scientific research interests: amorphous phase, disordered structure, electrical conductivity, metal, multilayer, semiconductor, thin film. | ||||
| Search for papers by Majková, E. in Crystallography Journals Online | Google Scholar | Pubmed | ||||