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Dr Matthias Schreck   Matthias Schreck (Institut für Physik, Universität Augsburg, Germany)
General scientific interests: crystal growth, defects, epitaxy, powder diffraction, residual stress, semiconductors, texture, thin films, twinning, X-ray diffraction.
Detailed scientific research interests: defects in thin films, Growth of heteroepitaxial diamond films, high resolution XRD, texture development.
Search for papers by Schreck, M. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Maxime DEUTSCH   Maxime DEUTSCH (CRM2, BP 70239, Boulevard des Aiguillettes, France)
General scientific interests: charge density, high pressure, incommensurate phases, X-ray diffraction.
Detailed scientific research interests: - Chiral magnet, - High pressure diffraction, - high resolution X-ray diffraction., - Joint refinement of XRD PND and Neutron diffraction data..
Search for papers by DEUTSCH, M in Crystallography Journals Online | Google Scholar | Pubmed
Professor Dr Andjelka Tonejc   Andjelka Tonejc (Department of Physics, Faculty of Science, Croatia)
General scientific interests: alloys, ceramics, electron diffraction, electron microscopy, materials science, metals, powder diffraction, Rietveld method, X-ray diffraction.
Detailed scientific research interests: crystal defects, electron diffraction,, high-resolution electron microscopy,, HRTEM image processing analysis,, nanocrystalline materials,, XRD line profile analysis.
Search for papers by Tonejc, A. in Crystallography Journals Online | Google Scholar | Pubmed