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Dr Shin-ya Matsuno   Shin-ya Matsuno (Analysis and Simulation Center, Asahi KASEI Co., Japan)
General scientific interests: anomalous dispersion, data collection and processing, diffuse scattering, imaging, instrumentation, polymers, powder diffraction, Rietveld method, semiconductors, small-angle scattering, surfaces, synchrotron radiation, texture, thin films, time-resolved studies, X-ray diffraction, X-ray optics, XAFS.
Detailed scientific research interests: grazing incidence diffraction, high resolution x-ray diffraction, in-situ x-ray diffraction, small angle scattering.
Search for papers by Matsuno, S in Crystallography Journals Online | Google Scholar | Pubmed

Dr Matej Jergel   Matej Jergel (Department of Multilayers and Nanostructures, Institute of Physics of the Slovak Academy of Sciences, Slovakia (Slovak Republic))
General scientific interests: materials science, small-angle scattering, surfaces, synchrotron radiation, thin films, X-ray diffraction, X-ray optics.
Detailed scientific research interests: grazing incidence small-angle X-ray scattering, grazing incidence X-ray diffraction, nanoparticle assemblies, planar and patterned multilayers, thin film nanostructures, X-ray specular and non-specular reflectometry.
Search for papers by Jergel, M. in Crystallography Journals Online | Google Scholar | Pubmed

Professor Dr Rolf Kohler   Rolf Köhler (Institut für Physik, Humboldt-Universität zu Berlin, Germany)
General scientific interests: anomalous dispersion, crystal growth, X-ray diffraction, X-ray optics, X-ray topography.
Detailed scientific research interests: diffraction theory, grazing incidence diffraction, grazing incidence small angle scattering, high resolution diffractometry, self organised mesoskopic semiconductor structures, strain in nearly perfect crystals, topography, X-ray contrast simulation.
Search for papers by Köhler, R. in Crystallography Journals Online | Google Scholar | Pubmed