IUCr services

 your search.

Results 1 to 8 of 8, sorted by name.

Dr Patrizia Imperatori   Patrizia Imperatori (Istituto di Struttura della Materia, Area della Ricerca di - CNR via Salaria km 29,500 Monterotondo Stazione RM , Roma, Italy)
General scientific interests: materials science, powder diffraction, Rietveld method, surfaces, thin films, X-ray diffraction.
Detailed scientific research interests: grazing incidence x-ray diffraction.
Search for papers by Imperatori, P. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Dr Siegfried Steeb   Siegfried Steeb (Max-Planck-Institut für Metallforschung, Institut für Werkstofforschung Seestr. 92, Germany)
General scientific interests: small-angle scattering.
Detailed scientific research interests: amorphous phase, diffraction, electron probe microanalysis, grazing incidence.
Search for papers by Steeb, S. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Osami Sakata   Osami Sakata (Center for Synchrotron Radiation Research, Japan Synchrotron Radiation Research Institute, Japan)
General scientific interests: dynamical diffraction, nanomaterials, surfaces, thin films, X-ray diffraction.
Detailed scientific research interests: grazing incidence, standing wave, surface diffraction, surface interface.
Search for papers by Sakata, O. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Dr Rolf Kohler   Rolf Köhler (Institut für Physik, Humboldt-Universität zu Berlin, Germany)
General scientific interests: anomalous dispersion, crystal growth, X-ray diffraction, X-ray optics, X-ray topography.
Detailed scientific research interests: diffraction theory, grazing incidence diffraction, grazing incidence small angle scattering, high resolution diffractometry, self organised mesoskopic semiconductor structures, strain in nearly perfect crystals, topography, X-ray contrast simulation.
Search for papers by Köhler, R. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Shin-ya Matsuno   Shin-ya Matsuno (Analysis and Simulation Center, Asahi KASEI Co., Japan)
General scientific interests: anomalous dispersion, data collection and processing, diffuse scattering, imaging, instrumentation, polymers, powder diffraction, Rietveld method, semiconductors, small-angle scattering, surfaces, synchrotron radiation, texture, thin films, time-resolved studies, X-ray diffraction, X-ray optics, XAFS.
Detailed scientific research interests: grazing incidence diffraction, high resolution x-ray diffraction, in-situ x-ray diffraction, small angle scattering.
Search for papers by Matsuno, S in Crystallography Journals Online | Google Scholar | Pubmed
Dr Matej Jergel   Matej Jergel (Department of Multilayers and Nanostructures, Institute of Physics of the Slovak Academy of Sciences, Slovakia (Slovak Republic))
General scientific interests: materials science, small-angle scattering, surfaces, synchrotron radiation, thin films, X-ray diffraction, X-ray optics.
Detailed scientific research interests: grazing incidence small-angle X-ray scattering, grazing incidence X-ray diffraction, nanoparticle assemblies, planar and patterned multilayers, thin film nanostructures, X-ray specular and non-specular reflectometry.
Search for papers by Jergel, M. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Peter Wobrauschek   Peter Wobrauschek (Atominstitut der Österreichischen Universitäten, Schüttelstraße 115, Austria)
Detailed scientific research interests: diffraction technique, grazing incidence, instrumentation and development of EDXRF spectrometer, total reflection X-ray fluorescence, X-ray fluorescence spectroscopy, X-ray polarization.
Search for papers by Wobrauschek, P. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Stephen B. Robie   Stephen B. Robie (Evans Analytical Group, 810 Kifer Rd, USA)
General scientific interests: electron diffraction, epitaxy, materials science, phase determination, residual stress, semiconductors, texture, thin films, X-ray diffraction.
Detailed scientific research interests: grazing incidence diffraction, high resolution X-ray diffraction, orientation imaging microscopy, semiconductor materials, thin film characterization, total reflection X-ray fluorescence, X-ray fluorescence spectroscopy, X-ray reflectivity.
Search for papers by Robie, S.B. in Crystallography Journals Online | Google Scholar | Pubmed