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Results 1 to 3 of 3, sorted by name.

Dr Stephen B. Robie   Stephen B. Robie (Evans Analytical Group, 810 Kifer Rd, USA)
General scientific interests: electron diffraction, epitaxy, materials science, phase determination, residual stress, semiconductors, texture, thin films, X-ray diffraction.
Detailed scientific research interests: grazing incidence diffraction, high resolution X-ray diffraction, orientation imaging microscopy, semiconductor materials, thin film characterization, total reflection X-ray fluorescence, X-ray fluorescence spectroscopy, X-ray reflectivity.
Search for papers by Robie, S.B. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Jun Kawai   Jun Kawai (Department of Materials Science and Engineering, Kyoto University, Japan)
General scientific interests: coordination chemistry, crystal chemistry, materials science, oxides, structural chemistry, surfaces, symmetry, X-ray optics, XAFS.
Detailed scientific research interests: Electron microscope, EXEFS, Extended X-ray emission fine structure, High resolution X-ray spectroscopy, X-ray fluorescence analysis, X-ray holography, X-ray reflectivity, X-ray total reflection.
Search for papers by Kawai, J. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Celso Gomes   Celso Gomes (Universidade de Aveiro, Departamento de Geociências, Aveiro, Portugal)
General scientific interests: ceramics, crystal growth, defects, electron microscopy, geochemistry, polymorphism, silicates, structure determination, zeolites.
Detailed scientific research interests: crystal form, crystallinity, crystallite, diffractometry, DTA, FTIR, mineralogy, paper, phyllosilicates, pigments, polytypism solid solution, scanning electron microscopy, sediments, size distribution, structure disorder, X-ray fluorescence high resolution.
Search for papers by Gomes, C. in Crystallography Journals Online | Google Scholar | Pubmed