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Dr Stephen B. Robie   Stephen B. Robie (Evans Analytical Group, 810 Kifer Rd, USA)
General scientific interests: electron diffraction, epitaxy, materials science, phase determination, residual stress, semiconductors, texture, thin films, X-ray diffraction.
Detailed scientific research interests: grazing incidence diffraction, high resolution X-ray diffraction, orientation imaging microscopy, semiconductor materials, thin film characterization, total reflection X-ray fluorescence, X-ray fluorescence spectroscopy, X-ray reflectivity.
Search for papers by Robie, S.B. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Kenji Sakurai   Kenji Sakurai (Synchrotron X-ray Group, National Institute for Materials Science, Japan)
General scientific interests: glasses, imaging, instrumentation, surfaces, thin films.
Detailed scientific research interests: 2D/3D real space imaging of polycrystalline materials, Structure of buried function interfaces, ultra trace element analysis, X-ray and neutron reflectivity, X-ray fluorescence and imaging.
Search for papers by Sakurai, K. in Crystallography Journals Online | Google Scholar | Pubmed