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Results 1 to 5 of 5, sorted by name.

Dr Sujit Kumar Halder   Sujit Kumar Halder (Crystal Growth and Characterization Section, National Physical Laboratory, India)
General scientific interests: crystal growth, defects, Laue diffraction, X-ray diffraction, X-ray topography.
Detailed scientific research interests: Crystal Growth, HRXRD, Thin films& multilayers, Topography.
Search for papers by Halder, S.K. in Crystallography Journals Online | Google Scholar | Pubmed
Dr KUAN-YING KOK   KUAN-YING KOK (INDUSTRIAL TECHNOLOGY DIVISION, MALAYSIAN INSTITUTE FOR NUCLEAR TECHNOLOGY RESEARCH (MINT), Malaysia)
General scientific interests: data collection and processing, defects, diffuse scattering, epitaxy, materials science, modulated structures, texture, thin films, X-ray diffraction.
Detailed scientific research interests: ANALYSIS OF THIN FILMS AND MULTILAYERS, DIFFUSE SCATTERING, POWDER DIFFRACTION.
Search for papers by KOK, K.Y. in Crystallography Journals Online | Google Scholar | Pubmed
Mr Mohandas Eladath   Mohandas Eladath (PMG, IGCAR, India)
General scientific interests: alloys, dynamical diffraction, imaging, Rietveld method.
Detailed scientific research interests: Electron microscopy, Phase transformation and phase stability, Thin films and multilayers, X-Ray diffraction.
Search for papers by Eladath, M. in Crystallography Journals Online | Google Scholar | Pubmed
Dr John Anthony Leake   John Anthony Leake (St John's College, University of Cambridge, United Kingdom)
General scientific interests: alloys, ceramics, defects, diffuse scattering, disorder, dynamical diffraction, electron diffraction, electron microscopy, epitaxy, glasses, materials science, metals, phase transitions, physical crystallography, powder diffraction, residual stress, semiconductors, superconductors, teaching and education, texture, thin films, X-ray diffraction.
Detailed scientific research interests: characterisation of materials, high resolution X-ray diffraction, multilayers, quantitative phase analysis, structural relaxation in glasses, thin films.
Search for papers by Leake, J.A. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Dr Thomas Brueckel   Thomas Brueckel (Institut fuer Festkoerperforschung IFF, Forschungszentrum Juelich GmbH, Germany)
General scientific interests: crystal growth, defects, diffuse scattering, disorder, epitaxy, instrumentation, magnetism, neutron scattering, phase transitions, synchrotron radiation, thin films, X-ray diffraction, X-ray optics.
Detailed scientific research interests: electron correlations and magnetism, high energy x-ray scattering, magnetic fluctuations and frustration, magnetic thin films and multilayers, magnetic x-ray and neutron scattering, synchrotron- and neutron instrumentation.
Search for papers by Brueckel, Th. in Crystallography Journals Online | Google Scholar | Pubmed