Results 1 to 5 of 5, sorted by name.
![]() | J. Kumar (Crystal Growth Centre, Anna University, India) General scientific interests: crystal growth, electron microscopy, semiconductors, surfaces, X-ray diffraction. Detailed scientific research interests: Characterization and Device Fabrication, Crystal:Growth, MOCVD, Organic LEDs, Semiconductor. | |||
Search for papers by Kumar, J. in Crystallography Journals Online | Google Scholar | Pubmed |
Leticia del Carmen Mogollón de Chalbaud (Physics, Universidad de los Andes, Venezuela) General scientific interests: aperiodic crystals, charge density, X-ray diffraction, XAFS. Detailed scientific research interests: Characterization of ultra thin films, Magnetics in Semiconductor Quasicrystals, State Solid Physics. | ||||
Search for papers by Mogollón de Chalbaud, L.C. in Crystallography Journals Online | Google Scholar | Pubmed |
Thais Cavalheri dos Santos Ribeirão Preto (Mechanical Engineering, Sao Judas University, Brazil) General scientific interests: defects, epitaxy, instrumentation, semiconductors, thin films. Detailed scientific research interests: Characterization of diodes for radiation detection, Effects of gamma irradiation on electric characteristics of power diodes, Electron, gamma and x-ray dosimetry, Radiation damage on semiconductor devices. | ||||
Search for papers by dos Santos Ribeirão Preto, T.C. in Crystallography Journals Online | Google Scholar | Pubmed |
![]() | Ramachandran Saravanan (Research Centre & PG Department of Physics, The Madura College, India) General scientific interests: alloys, anomalous dispersion, Rietveld method, X-ray diffraction, XAFS. Detailed scientific research interests: Anharmonic thermal vibrations, Charge density Studies, Maximum Entropy Method, Modulated Structures, Multipole Analysis of Charge Densities, Pair Distribution Function, Semiconductor Characterization. | |||
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Stephen B. Robie (Evans Analytical Group, 810 Kifer Rd, USA) General scientific interests: electron diffraction, epitaxy, materials science, phase determination, residual stress, semiconductors, texture, thin films, X-ray diffraction. Detailed scientific research interests: grazing incidence diffraction, high resolution X-ray diffraction, orientation imaging microscopy, semiconductor materials, thin film characterization, total reflection X-ray fluorescence, X-ray fluorescence spectroscopy, X-ray reflectivity. | ||||
Search for papers by Robie, S.B. in Crystallography Journals Online | Google Scholar | Pubmed |