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Results 1 to 5 of 5, sorted by name.

Professor J. Kumar   J. Kumar (Crystal Growth Centre, Anna University, India)
General scientific interests: crystal growth, electron microscopy, semiconductors, surfaces, X-ray diffraction.
Detailed scientific research interests: Characterization and Device Fabrication, Crystal:Growth, MOCVD, Organic LEDs, Semiconductor.
Search for papers by Kumar, J. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Leticia del Carmen Mogollon de Chalbaud   Leticia del Carmen Mogollón de Chalbaud (Physics, Universidad de los Andes, Venezuela)
General scientific interests: aperiodic crystals, charge density, X-ray diffraction, XAFS.
Detailed scientific research interests: Characterization of ultra thin films, Magnetics in Semiconductor Quasicrystals, State Solid Physics.
Search for papers by Mogollón de Chalbaud, L.C. in Crystallography Journals Online | Google Scholar | Pubmed
Professor Dr Thais Cavalheri dos Santos Ribeirao Preto   Thais Cavalheri dos Santos Ribeirão Preto (Mechanical Engineering, Sao Judas University, Brazil)
General scientific interests: defects, epitaxy, instrumentation, semiconductors, thin films.
Detailed scientific research interests: Characterization of diodes for radiation detection, Effects of gamma irradiation on electric characteristics of power diodes, Electron, gamma and x-ray dosimetry, Radiation damage on semiconductor devices.
Search for papers by dos Santos Ribeirão Preto, T.C. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Ramachandran Saravanan   Ramachandran Saravanan (Research Centre & PG Department of Physics, The Madura College, India)
General scientific interests: alloys, anomalous dispersion, Rietveld method, X-ray diffraction, XAFS.
Detailed scientific research interests: Anharmonic thermal vibrations, Charge density Studies, Maximum Entropy Method, Modulated Structures, Multipole Analysis of Charge Densities, Pair Distribution Function, Semiconductor Characterization.
Search for papers by Saravanan, R. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Stephen B. Robie   Stephen B. Robie (Evans Analytical Group, 810 Kifer Rd, USA)
General scientific interests: electron diffraction, epitaxy, materials science, phase determination, residual stress, semiconductors, texture, thin films, X-ray diffraction.
Detailed scientific research interests: grazing incidence diffraction, high resolution X-ray diffraction, orientation imaging microscopy, semiconductor materials, thin film characterization, total reflection X-ray fluorescence, X-ray fluorescence spectroscopy, X-ray reflectivity.
Search for papers by Robie, S.B. in Crystallography Journals Online | Google Scholar | Pubmed