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Professor Dr Daniel Chateigner   Daniel Chateigner (IUT-Caen and CRISMAT, U. Caen and ENSICAEN, France)
General scientific interests: Laue diffraction, Rietveld method, X-ray diffraction, X-ray optics, X-ray topography.
Detailed scientific research interests: Combined Microstructure-Texture-Structure-Stress analysis, Combined Texture-Reflectivity analysis, Quantitative Texture Analysis.
Search for papers by Chateigner, D. in Crystallography Journals Online | Google Scholar | Pubmed
Dr Xiaodong Wang   Xiaodong Wang (Central Analytical Research Facility, Queensland University of Technology, Australia)
General scientific interests: instrumentation, residual stress, Rietveld method, texture, thin films.
Detailed scientific research interests: Line Profile Analysis, Quantitative Phase Analysis, residual stress, Stacking fault, texture, thin films.
Search for papers by Wang, X. in Crystallography Journals Online | Google Scholar | Pubmed